Metallized film capacitors are widely used in modern equipment. When this type of capacitors work in pulse mode, electrode contact destruction is the main reason of failure. Therefore, an experimental method for modeling the electrodynamic destruction of electrode contacts of a metallized film capacitor was developed. The experiments for investigating the destruction regularities due to the impact of current pulses with different amplitude and polarity were done. It was determined, that the probability of electrode contact failure is described by the normal distribution law. The dependences of electrode contacts lifetime versus current pulse energy were determined and a power law of aging was obtained. The polarity effect of contact destruction was found: the lifetime is less under impact of negative current pulses. The erosion velocity of metallization in electrode contact was calculated.